DocumentCode :
2097573
Title :
Mechanical load effects on the electrostrictive strain of P(VDF-TrFE) copolymer and the development of a high-resolution hydrostatic-pressure dilatometer
Author :
Gross, S.J. ; Cheng, Z.-Y. ; Bharti, V. ; Zhang, Q.M.
Author_Institution :
Mater. Res. Lab., Pennsylvania State Univ., University Park, PA, USA
Volume :
2
fYear :
1999
fDate :
1999
Firstpage :
1019
Abstract :
The high electric field induced strain response and elastic energy density recently observed in the electron irradiated P(VDF-TrFE) copolymer beckons its adoption in transducer applications. Due to its compliant nature however, concern exists over the effect of mechanical stress on the electrically induced strain. This paper investigates the electrostrictive strain-response of the irradiated copolymer in the longitudinal (parallel to the field) direction as a function of hydrostatic pressure and in the transverse direction as a function of tensile stress. The longitudinal strain was characterized via the development of an automated hydrostatic-pressure dilatometer specifically designed for compliant films. Various performance parameters of this bimorph-based strain sensor are analyzed including the noise, resolution and frequency response. The results are compared with similar data from axially stressed samples that corroborate the conclusion that this modified copolymer exhibits a high load capability
Keywords :
electron beam effects; electrostriction; extensometers; high-pressure effects; polymer blends; strain sensors; P(VDF-TrFE) copolymer; compliant films; elastic energy density; electron irradiated polymer; electrostrictive strain; frequency response; high-resolution hydrostatic-pressure dilatometer; load capability; strain sensor; tensile stress; Acoustic materials; Acoustic transducers; Capacitive sensors; Electrostriction; Instruments; Piezoelectric materials; Polymer films; Strain measurement; Stress; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849169
Filename :
849169
Link To Document :
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