Design of Multilayered Epsilon-Near-Zero Microwave Planar Sensor for Testing of Dispersive Materials

A novel planar multilayered epsilon-near-zero (ENZ) tunnel sensor based on fully laminated surface integrated waveguide (SIW) technology is proposed for the microwave measurement of dispersive materials. The proposed sensor is designed and optimized using parametric analysis to obtain the multilayered ENZ tunnel dimensions. It is observed that the width of the upper tunnel of the designed two-tunnel sensor should be at least half of the SIW width of the actual SIW structure for the multiband operation. The complex permittivity measurement using the proposed sensor is possible at two frequencies with a single set of measurement data. The proposed method is based on perturbation of the squeezed electric field having constant magnitude and high intensity inside the multilayered ENZ tunnel, which eventually increases the sensitivity of the proposed sensor. The sensitivity and accuracy of the proposed sensor are tested using both the simulated and the experimented data. It is found that the proposed sensor is highly sensitive, and typically demonstrates 6% error under ideal conditions, thus making it a good candidate for the microwave measurement of dispersive materials.