DocumentCode
2097750
Title
Nonlinear finite element analysis of piezoelectric transducers
Author
Simkovics, R. ; Landes, H. ; Kaltenbacher, M. ; Lerch, R.
Author_Institution
Dept. of Electr. Meas. Technol., Johannes Kepler Univ., Linz, Austria
Volume
2
fYear
1999
fDate
1999
Firstpage
1057
Abstract
In this paper a newly developed finite element method (FEM) is presented, which allows the numerical simulation of the nonlinear behavior of piezoelectric materials. Since both, material as well as geometric nonlinearities are taken into account, full large-signal analysis of the piezoelectric effect is provided. In the implemented constitutive model, the mechanical, piezoelectric, and dielectric tensor elements may depend in a multifunctional way on the current states of the mechanical stresses and the electric field. Therewith, measured material data can be directly used as input for the numerical simulations. In the case of geometric nonlinearities, both large displacements and strains can be modeled. As a practical application, the electric input impedance of an ultrasonic transducer being subjected to mechanical and electric prestressing is considered. Comparisons of simulated and measured resonance frequency shifts due to the nonlinear dependency of the material coefficients on the electric field as well as mechanical stress is presented
Keywords
finite element analysis; piezoelectric transducers; constitutive model; dielectric tensor elements; electric field; electric input impedance; full large-signal analysis; geometric nonlinearities; material coefficients; mechanical stresses; nonlinear behavior; nonlinear finite element analysis; numerical simulation; piezoelectric transducers; Capacitive sensors; Dielectric materials; Dielectric measurements; Finite element methods; Numerical simulation; Piezoelectric effect; Piezoelectric materials; Piezoelectric transducers; Tensile stress; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location
Caesars Tahoe, NV
ISSN
1051-0117
Print_ISBN
0-7803-5722-1
Type
conf
DOI
10.1109/ULTSYM.1999.849182
Filename
849182
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