• DocumentCode
    2097782
  • Title

    Current reconstruction techniques for survivable three phase PWM converters

  • Author

    Jiang, Wei ; Fahimi, Babak

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Texas at Arlington, Arlington, TX
  • fYear
    2009
  • fDate
    3-6 May 2009
  • Firstpage
    888
  • Lastpage
    893
  • Abstract
    In high performance three phase pulse width modulated (PWM) converter systems, failure of current sensors will interrupt the system performance and even cause disastrous consequences without in-time maintenance. Redundancy design is one of the popular choices to overcome the issue. However, this usually leads to an undesirable increase in size and cost. This paper will present two novel model-independent genetic current reconstruction technique with digital implementation for three phase PWM converter systems. Using proposed sensor placement and software algorithm, phase currents within a three phase converter can be reconstructed to an acceptable level of accuracy under single-survived-sensor (S3) scenario. A hardware prototype is built and fault tolerant algorithms are implemented using a digital signal processor (TMS320F2812). Experiments are conducted under worst case scenario to verify the flexibility of sensor placement/converter layout and software algorithm.
  • Keywords
    PWM power convertors; digital signal processing chips; electric machine analysis computing; fault tolerance; converter layout; current reconstruction technique; current sensor; digital signal processor; fault tolerant algorithms; phase current; phase pulse width modulated converter system; redundancy design; single-survived-sensor; software algorithm; survivable three phase PWM converter; Costs; Genetics; Phase modulation; Pulse width modulation; Pulse width modulation converters; Redundancy; Sensor systems; Signal processing algorithms; Software algorithms; System performance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electric Machines and Drives Conference, 2009. IEMDC '09. IEEE International
  • Conference_Location
    Miami, FL
  • Print_ISBN
    978-1-4244-4251-5
  • Electronic_ISBN
    978-1-4244-4252-2
  • Type

    conf

  • DOI
    10.1109/IEMDC.2009.5075309
  • Filename
    5075309