DocumentCode :
2098361
Title :
Virtual colon tagging for electronic cleansing in dual-energy fecal-tagging CT colonography
Author :
Wenli Cai ; Se Hyung Kim ; June-Goo Lee ; Yoshida, Hiroyuki
Author_Institution :
Med. Sch., Dept. of Radiol., Harvard Univ., Boston, MA, USA
fYear :
2012
fDate :
Aug. 28 2012-Sept. 1 2012
Firstpage :
3736
Lastpage :
3739
Abstract :
Partial volume effect (PVE) and tagging inhomogeneity are two major causes of artifacts in electronic cleansing (EC) for fecal-tagging CT colonography (CTC). Our purpose was to develop a novel method called “virtual tagging” for electronic cleansing in dual-energy fecal-tagging CTC. A three-material decomposition scheme was first applied in dual-energy CTC to decompose each voxel into a mixture of air, soft tissue, and iodine-tagged fecal material. The entire colonic lumen was then marked by virtually tagging the mixture portion of luminal air at each voxel. As a result, colon lumen including air and tagged materials was segmented and subtracted by their high values in virtually tagged images. Our virtual tagging scheme provides a cleansed colon that is free from artifacts caused by the PVE at air-tagging mixture and inhomogeneous tagging.
Keywords :
biological tissues; cancer; cellular biophysics; computerised tomography; gas mixtures; identification technology; medical image processing; air-tagging mixture; cleansed colon; colonic lumen; dual-energy fecal-tagging CT colonography; electronic cleansing; inhomogeneous tagging; iodine-tagged fecal material; luminal air; mixture portion; partial volume effect; soft tissue; three-material decomposition scheme; virtual colon tagging; virtual tagging scheme; virtually tagged imaging; Colon; Colonography; Computed tomography; Image segmentation; Nonhomogeneous media; Tagging; Animals; Artifacts; Colon; Colonography, Computed Tomographic; Electronics, Medical; Feces; Humans; Sus scrofa; User-Computer Interface;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
ISSN :
1557-170X
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2012.6346779
Filename :
6346779
Link To Document :
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