DocumentCode
2098431
Title
Real-time estimation of R, L, and C parameters under non sinusoidal conditions: A proposal
Author
Ferrigno, Luigi ; Laracca, Marco ; Liguori, Consolatina ; Pietrosanto, Antonio
Author_Institution
DAEIMI, Univ. of Cassino, Cassino, Italy
fYear
2011
fDate
10-12 May 2011
Firstpage
1
Lastpage
6
Abstract
Modern electric and electronic devices frequently work with non sinusoidal waveforms, then, all the passive R, L, and C components present in these circuits are involved with non sinusoidal stimuli. Consequently, the behaviors of these components in presence of non sinusoidal environments have to be estimated. In previous researches authors proposed a suitable measurement method for the estimation of R, L and C parameters of passive components in non sinusoidal conditions. This paper deals with the realization of a real-time FPGA-based instrument, able to continuously update the estimated values of the considered components. Core of the realized instrument is the digital signal processing section that applies the previously proposed measurement method, based on a parameter estimation technique. This last can be implemented is a sequential (i.e. point by point) algorithm, suitable for the development on a FPGA platform. This implementation allows minimizing both required memory and computational burden. After a preliminary tuning of the measurement method, both the hardware and the software architectures of the realized measurement instrument are described. Experimental tests carried out in a suitable emulation environment and experiments on real R, L and C passive components are carried out in order to characterize the instrument.
Keywords
digital signal processing chips; field programmable gate arrays; instruments; measurement systems; parameter estimation; FPGA-based instrument; RLC parameter; digital signal processing; measurement instrument; parameter estimation; passive component; real-time estimation; sequential algorithm; sinusoidal waveform; Estimation; Field programmable gate arrays; Hardware; Instruments; Integrated circuit modeling; Microprogramming; Parameter estimation; Equivalent Circuits; Non-sinusoidal characterization; RLC measurement; System identification;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location
Binjiang
ISSN
1091-5281
Print_ISBN
978-1-4244-7933-7
Type
conf
DOI
10.1109/IMTC.2011.5944189
Filename
5944189
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