DocumentCode :
2098643
Title :
Evaluating DACs linearity and intermodulation errors through an ANOVA approach
Author :
D´Arco, Mauro ; Liccardo, Annalisa ; Pasquino, Nicola
Author_Institution :
Dept. of Electr. Eng., Univ. of Naples Federico II, Naples, Italy
fYear :
2011
fDate :
10-12 May 2011
Firstpage :
1
Lastpage :
5
Abstract :
In order to assess the performance of digital to analog converters (DAC) the attention is generally focused on the integral nonlinearity (INL). Useful diagnostic tools to detect the causes of poor linearity are the linearity and intermodulation errors, which can be evaluated from INL measurements. Linearity and intermodulation errors highlight and quantify erroneous calibration and unwanted interactions between current sources inside the DAC hardware. Unfortunately, their estimates, especially those related to high order intermodulation errors are characterized by high uncertainty. It is thus difficult assessing their relevance on the base of their very uncertain value. It is shown that by means of the analysis of variance (ANOVA) the relevance of intermodulation errors can be assessed from a limited set of INL measurements. ANOVA is in fact capable of distinguishing if the variance in INL measurements has to be addressed to active factors or noise, even if the effect of each factor is widespread upon different elements of the INL array and in different combinations with the other factors.
Keywords :
calibration; constant current sources; digital-analogue conversion; intermodulation; statistical analysis; ANOVA approach; DAC linearity evaluation; INL array; INL measurement; analysis of variance approach; current source; digital to analog converter; erroneous calibration; high order intermodulation error; integral nonlinearity; Analysis of variance; Linearity; Matrix converters; Noise; Software; Uncertainty; Voltage measurement; contrasts; integral nonlinearity; intermodulation errors; linearity errors; test matrix;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location :
Binjiang
ISSN :
1091-5281
Print_ISBN :
978-1-4244-7933-7
Type :
conf
DOI :
10.1109/IMTC.2011.5944196
Filename :
5944196
Link To Document :
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