Title :
A statistical performance simulation methodology for VLSI circuits
Author :
Orshansky, Michael ; Chen, James C. ; Hu, Chenming
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., California Univ., Berkeley, CA, USA
Abstract :
A statistical performance simulation (SPS) methodology for VLSI circuits is presented. Traditional methods of worst-case corner analysis lack accuracy and Monte-Carlo simulations cannot be applied to VLSI circuits because of their complexity. SPS methodology is accurate because no statistical information about the device parameter variation is lost. It achieves efficiency by analyzing the smaller circuit blocks and generating the performance distribution for the entire circuit. Circuit evaluation at any specified performance level is possible.
Keywords :
VLSI; circuit analysis computing; performance evaluation; Monte-Carlo simulations; VLSI circuits; device parameter; performance distribution; statistical performance simulation; worst-case corner analysis; CMOS technology; Circuit optimization; Circuit simulation; Energy consumption; Permission; Predictive models; Principal component analysis; SPICE; Stochastic processes; Very large scale integration;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
