DocumentCode
2099041
Title
Suppressing the Thermal Broadening/Instability of On-chip Ultra-high Q Silicon Microdisk Resonators
Author
Soltani, Mohammad ; Yegnanarayanan, Siva ; Li, Qing ; Adibi, Ali
Author_Institution
Georgia Inst. of Technol., Atlanta
fYear
2007
fDate
21-25 Oct. 2007
Firstpage
198
Lastpage
199
Abstract
Ultra-high Q microdisk resonators are fabricated and demonstrated on silicon-on-insulator platform. The presence of oxide substrate and a thin Si pedestal layer dramatically reduce the thermal resistance, thereby, increasing input optical power threshold for thermal instability. Critical coupling for a <2~2times106 is experimentally observed.
Keywords
elemental semiconductors; laser cavity resonators; silicon; Si; input optical power; on-chip ultra-high Q silicon microdisk resonators; thermal broadening/instability; thermal resistance; Couplings; Optical refraction; Optical resonators; Optical variables control; Optical waveguides; Silicon on insulator technology; Tellurium; Temperature; Thermal conductivity; Thermal resistance;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location
Lake Buena Vista, FL
ISSN
1092-8081
Print_ISBN
978-1-4244-0925-9
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2007.4382345
Filename
4382345
Link To Document