DocumentCode :
2099479
Title :
Quality control technology of conforming run length in a six sigma process
Author :
Wu Dehui
Author_Institution :
Key Lab. of Numerical Control of Jiangxi Province, Jiujiang Univ., Jiujiang, China
fYear :
2010
fDate :
29-31 July 2010
Firstpage :
5569
Lastpage :
5573
Abstract :
To meet the demands of the quality management development of modern enterprise, a conforming run length (CRL) control charts based on the number of consecutive conforming items is presented. This paper points out a new opinion of the optical limits through the analysis of the variation between the control limits of CRL control charts and the probabilities as well as the costs of the two types of the errors and tests. Its related conclusions were last analyzed, which effectively satisfies the demands for achieving the six sigma quality level.
Keywords :
control charts; quality control; six sigma (quality); conforming run length control chart; quality control technology; quality management development; six sigma process; Control charts; Electronic mail; Laboratories; Optimization; Process control; Quality control; Six sigma; Conforming Run Length(CRL); Control Charts; Control Limits; Six Sigma Process;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control Conference (CCC), 2010 29th Chinese
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6263-6
Type :
conf
Filename :
5573131
Link To Document :
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