Title :
Introducing redundant computations in a behavior for reducing BIST resources
Author :
Parulkar, Ishwar ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Sun Microsyst., Sunnyvale, CA, USA
Abstract :
The degree of freedom that can be exploited during scheduling and assignment to minimize BIST resources is often limited by the data dependencies of a behavior. We propose transformation of a behavior by introducing redundant computations such that the resulting data path requires few BIST resources. The transformation makes use of spare capacity of modules to add redundancy that enables test paths to be shared among the modules. A technique is presented for introducing redundant computations that reduce the BIST resource requirements of a data path without compromising the latency and functional resource constraints.
Keywords :
built-in self test; logic testing; BIST resources reduction; data dependencies; degree of freedom; functional resource constraints; latency; redundant computations; Automatic testing; Built-in self-test; Delay; Libraries; Logic testing; Permission; Processor scheduling; Registers; Sun; Test pattern generators;
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5