DocumentCode :
2099817
Title :
Introducing redundant computations in a behavior for reducing BIST resources
Author :
Parulkar, Ishwar ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution :
Sun Microsyst., Sunnyvale, CA, USA
fYear :
1998
fDate :
19-19 June 1998
Firstpage :
548
Lastpage :
553
Abstract :
The degree of freedom that can be exploited during scheduling and assignment to minimize BIST resources is often limited by the data dependencies of a behavior. We propose transformation of a behavior by introducing redundant computations such that the resulting data path requires few BIST resources. The transformation makes use of spare capacity of modules to add redundancy that enables test paths to be shared among the modules. A technique is presented for introducing redundant computations that reduce the BIST resource requirements of a data path without compromising the latency and functional resource constraints.
Keywords :
built-in self test; logic testing; BIST resources reduction; data dependencies; degree of freedom; functional resource constraints; latency; redundant computations; Automatic testing; Built-in self-test; Delay; Libraries; Logic testing; Permission; Processor scheduling; Registers; Sun; Test pattern generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 1998. Proceedings
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-89791-964-5
Type :
conf
Filename :
724532
Link To Document :
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