DocumentCode
2099817
Title
Introducing redundant computations in a behavior for reducing BIST resources
Author
Parulkar, Ishwar ; Gupta, Sandeep K. ; Breuer, Melvin A.
Author_Institution
Sun Microsyst., Sunnyvale, CA, USA
fYear
1998
fDate
19-19 June 1998
Firstpage
548
Lastpage
553
Abstract
The degree of freedom that can be exploited during scheduling and assignment to minimize BIST resources is often limited by the data dependencies of a behavior. We propose transformation of a behavior by introducing redundant computations such that the resulting data path requires few BIST resources. The transformation makes use of spare capacity of modules to add redundancy that enables test paths to be shared among the modules. A technique is presented for introducing redundant computations that reduce the BIST resource requirements of a data path without compromising the latency and functional resource constraints.
Keywords
built-in self test; logic testing; BIST resources reduction; data dependencies; degree of freedom; functional resource constraints; latency; redundant computations; Automatic testing; Built-in self-test; Delay; Libraries; Logic testing; Permission; Processor scheduling; Registers; Sun; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 1998. Proceedings
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-89791-964-5
Type
conf
Filename
724532
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