• DocumentCode
    2099826
  • Title

    Comparison of fault detection techniques: problem and solution

  • Author

    Lou, S.J. ; Budman, H. ; Duever, T.A.

  • Author_Institution
    Dept. of Chem. Eng., Waterloo Univ., Ont., Canada
  • Volume
    6
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    4513
  • Abstract
    Haar Wave-Net (HWN) and Projection Pursuit Regression (PPR) are two useful modeling tools for pattern classification. In this case study, the two methodologies are compared with respect to the problem of misclassification close to class boundaries with sparse training data. A variety of examples were specifically tailored to elucidate their respective properties. It is observed that PPR locates the class boundaries at the midline of two classes of training data, which is a logical choice for the class boundary location, in the absence of sufficient information. For HWN, both the initial positioning of receptive fields and the density of training data near the class boundary may both have great impact on the definition of the class boundary. To solve the problem of insufficient training data, the data void can be filled with artificial data according to their nearest neighborhood. PPR propagates the effect of noisy data to a distance determined by the midpoint between the noisy data and the good data, in the projected input space. On the other hand, the orthonormal and localized properties of the Haar basis functions enable a HWN to limit the noise effect within its local receptive fields. This is a major advantage, which the HWN has over the PPR.
  • Keywords
    Haar transforms; fault location; pattern classification; Haar wave-net regression; fault detection techniques; misclassification; pattern classification; projection pursuit regression; receptive fields; sparse training data; training data; Approximation error; Chemical engineering; Data analysis; Extrapolation; Fault detection; Least squares approximation; Neural networks; Pattern classification; Training data;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2002. Proceedings of the 2002
  • ISSN
    0743-1619
  • Print_ISBN
    0-7803-7298-0
  • Type

    conf

  • DOI
    10.1109/ACC.2002.1025361
  • Filename
    1025361