• DocumentCode
    2099866
  • Title

    FMECA technique on photovoltaic module

  • Author

    Catelani, Marcantonio ; Ciani, Lorenzo ; Cristaldi, Loredana ; Faifer, Marco ; Lazzaroni, Massimo ; Rinaldi, Paola

  • Author_Institution
    Dipt. di Elettron. e Telecomun., Univ. degli Studi di Firenze, Firenze, Italy
  • fYear
    2011
  • fDate
    10-12 May 2011
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The solar photovoltaic industry has seen rapid expansion in the past decade with an ever-increasing share of the electricity-generating capacity for the world. For the emerging photovoltaic (PV) industry the assessment of the quality and reliability of its products is becoming more and more important. To this aim and to ensure an optimal design and material choice, a failure modes, effects and criticality analysis methodology (FMECA) to classify the occurrence, the severity and the impact of all possible failure mechanisms on the PV system has been introduced. This helps to eliminate or reduce the impact of potential failure modes before the completion of the design and before failures occur in the field. By means of this analysis it can be noticed that a crucial aspect in PV systems is the cleaning status of the panel surface. In this paper this problem has been analyzed by means of an experimental activity. Finally a method for the assessment of the PV panel condition has been proposed.
  • Keywords
    failure analysis; photovoltaic power systems; solar cells; solar power stations; FMECA technique; PV panel; electricity-generating capacity; failure mode effect and criticality analysis methodology; photovoltaic module; solar PV industry; solar photovoltaic industry; Cleaning; Light sources; Maintenance engineering; Photovoltaic systems; Powders; Reliability; Safety; Dependability; Diagnostic; FMEA; FMECA; Failure mode; Fault; Perceived Solar Radiation Level; Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
  • Conference_Location
    Binjiang
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-7933-7
  • Type

    conf

  • DOI
    10.1109/IMTC.2011.5944245
  • Filename
    5944245