DocumentCode
2099991
Title
EMI emissions up to 1 GHz from adjustable speed drives
Author
Wisniewski, Matthew ; Kubichek, Robert ; Pierre, John
Author_Institution
Lockheed-Martin, Colorado Springs, CO, USA
Volume
1
fYear
2001
fDate
2001
Firstpage
113
Abstract
Electromagnetic interference (EMI) has always been a problem with motors and motor controllers. Older drives based on analog circuit technology generated EMI primarily at harmonic frequencies well below 1 MHz. However, within the last decade or so, the popularity of solid-state adjustable speed drives (ASD) has increased greatly, and such systems are being widely deployed. The new systems use pulse-width modulation (PWM) techniques and high-speed switching circuits to achieve better control and higher efficiency. Unfortunately, they also tend to generate EMI at much higher frequencies than older systems. As a consequence, EMI problems are beginning to appear in unexpected locations where new drives have replaced older technology (e.g., elevators and HVAC installations). This paper studies ASD-generated EMI at frequency ranges up to 1 GHz. It describes measurements made on inverters and ASDs that determine EMI frequency and time-domain characteristics. Tests include spectrum analyzer measurements as well as time domain power analysis using zero-span techniques. Tests are made at different lateral ranges within a building and in an open field, as well as within a building on different floors
Keywords
AC motor drives; DC-AC power convertors; PWM invertors; electromagnetic interference; machine testing; machine theory; spectral analysis; time-domain analysis; variable speed drives; 1 GHz; AC motor drives; ASDs; EMI; HVAC; electromagnetic interference; frequency characteristics; high-speed switching circuits; inverters; pulse-width modulation techniques; solid-state adjustable speed drives; spectrum analyzer measurements; time domain power analysis; time-domain characteristics; zero-span techniques; Analog circuits; Electromagnetic interference; Frequency; Pulse circuits; Pulse width modulation; Solid state circuits; Space vector pulse width modulation; Testing; Time domain analysis; Variable speed drives;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics Society, 2001. IECON '01. The 27th Annual Conference of the IEEE
Conference_Location
Denver, CO
Print_ISBN
0-7803-7108-9
Type
conf
DOI
10.1109/IECON.2001.976464
Filename
976464
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