DocumentCode
2100258
Title
Automatic detection of internal defects in solar cells
Author
Lin, Wu-Ja ; Lei, Yu-Hsien ; Huang, Chih-Hsien
Author_Institution
Dept. of Comput. Sci. & Inf. Eng., Nat. Formosa Univ., Huwei, Taiwan
fYear
2011
fDate
10-12 May 2011
Firstpage
1
Lastpage
4
Abstract
In this manuscript, a system which automatically detects internal defects in solar cell is proposed. The proposed system applies a bias flow to the solar cell, captures emissions of solar cell, and processes captured image to recognize the internal defects of the solar cell. The experimental results show that the proposed system can successfully detect the internal defect of solar cell which can not be found by visual inspection.
Keywords
inspection; solar cells; automatic detection; internal defects; solar cells; Cameras; Charge coupled devices; Image processing; Inspection; Photovoltaic cells; Pixel; Silicon; automatic inspection; image processing; internal crack; solar cell;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
Conference_Location
Binjiang
ISSN
1091-5281
Print_ISBN
978-1-4244-7933-7
Type
conf
DOI
10.1109/IMTC.2011.5944258
Filename
5944258
Link To Document