• DocumentCode
    2100258
  • Title

    Automatic detection of internal defects in solar cells

  • Author

    Lin, Wu-Ja ; Lei, Yu-Hsien ; Huang, Chih-Hsien

  • Author_Institution
    Dept. of Comput. Sci. & Inf. Eng., Nat. Formosa Univ., Huwei, Taiwan
  • fYear
    2011
  • fDate
    10-12 May 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this manuscript, a system which automatically detects internal defects in solar cell is proposed. The proposed system applies a bias flow to the solar cell, captures emissions of solar cell, and processes captured image to recognize the internal defects of the solar cell. The experimental results show that the proposed system can successfully detect the internal defect of solar cell which can not be found by visual inspection.
  • Keywords
    inspection; solar cells; automatic detection; internal defects; solar cells; Cameras; Charge coupled devices; Image processing; Inspection; Photovoltaic cells; Pixel; Silicon; automatic inspection; image processing; internal crack; solar cell;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference (I2MTC), 2011 IEEE
  • Conference_Location
    Binjiang
  • ISSN
    1091-5281
  • Print_ISBN
    978-1-4244-7933-7
  • Type

    conf

  • DOI
    10.1109/IMTC.2011.5944258
  • Filename
    5944258