• DocumentCode
    2100567
  • Title

    Functional verification of large ASICs

  • Author

    Evans, Adrian ; Silburt, Allan ; Vrckovnik, Gary ; Brown, Thane ; Dufresne, Mario ; Hall, Geoffrey ; Ho, Tung ; Liu, Ying

  • Author_Institution
    Nortel, Ottawa, Ont., Canada
  • fYear
    1998
  • fDate
    19-19 June 1998
  • Firstpage
    650
  • Lastpage
    655
  • Abstract
    This paper describes the functional verification effort during a specific hardware development program that included three of the largest ASPCs designed at Nortel. These devices marked a transition point in methodology as verification took front and centre on the critical path of the ASIC schedule. Both the simulation and emulation strategies are presented. The simulation methodology introduced new techniques such as ASIC sub-system level behavioural modeling, large multi-chip simulations, and random pattern simulations. The emulation strategy was based on a plan that consisted of integrating parts of the real software on the emulated system. This paper describes how these technologies were deployed, analyzes the bugs that were found and highlights the bottlenecks in functional verification as systems become more complex.
  • Keywords
    application specific integrated circuits; formal verification; logic testing; ASIC; emulation; functional verification; hardware development program; simulation; Analytical models; Application specific integrated circuits; Circuit simulation; Computer bugs; Emulation; Hardware; Permission; Printed circuits; Protocols; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 1998. Proceedings
  • Conference_Location
    San Francisco, CA, USA
  • Print_ISBN
    0-89791-964-5
  • Type

    conf

  • Filename
    724551