DocumentCode
2101226
Title
Nitride-Based UV Lasers
Author
Amano, H. ; Kato, N. ; Okada, N. ; Kawashima, T. ; Iida, K. ; Nagamatsu, K. ; Imura, M. ; Balakrishnan, K. ; Iwaya, M. ; Kamiyama, S. ; Akasaki, I. ; Bandoh, A.
Author_Institution
Meijo Univ., Nagoya
fYear
2007
fDate
21-25 Oct. 2007
Firstpage
380
Lastpage
381
Abstract
The ultraviolet (UV) laser diode (LD) is attracting much attention for various novel applications such as in medical engineering, sterilization and high density optical storage. Group III nitrides are one of the most promising candidates to realize UV LD. The external quantum efficiency of group-Ill nitride-based light-emitting diodes (LEDs) with emission wavelength shorter than 360 nm is still far inferior to that of nitride-based visible-short-wavelength LEDs. Simulation results show that there is no theoretical barrier which hiders the realization of short wavelength UV LDs (Chow, 2005). At the moment, however, the shortest emission wavelength of nitride-based LD is limited to 343nm on SiC (Edmond, 2004) and 350.9 nm on a sapphire substrate (Iida, 2004). In order to overcome the barrier for emission wavelength and to realize much shorter wavelength UV LDs, in addition to the control of conductivity for both n-type and p-type layers, the growth of low-dislocation-density high-Al-content AlGaN with low internal loss is essential.
Keywords
aluminium compounds; dislocation density; light emitting diodes; nitrogen compounds; sapphire; semiconductor lasers; silicon compounds; Al2O3; AlGaN; LED; SiC; UV LD; emission wavelength; external quantum efficiency; group III nitrides; light-emitting diodes; low-dislocation-density; n-type layers; nitride-based UV lasers; p-type layers; sapphire substrate; ultraviolet laser diode; Aluminum gallium nitride; Biomedical engineering; Dielectrics; Diode lasers; Gallium nitride; Laser theory; Light emitting diodes; Research and development; Substrates; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location
Lake Buena Vista, FL
ISSN
1092-8081
Print_ISBN
978-1-4244-0925-9
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2007.4382437
Filename
4382437
Link To Document