DocumentCode
2101758
Title
Passivation layer effects on power durability of SAW duplexer
Author
Jin Yong Kim ; Hyeong Joon Kim ; Hyun Min Cho ; Hyung Kook Yang ; Jong Chul Park
Author_Institution
Sch. of Mater. Sci. & Eng., Seoul Nat. Univ., South Korea
Volume
1
fYear
1999
fDate
17-20 Oct. 1999
Firstpage
39
Abstract
The power durability of the ladder-type SAW filter was investigated with various electrode materials and passivation layers. Among the aluminum alloys, the Al-2%Cu electrode showed the longest lifetime. In addition, the Al-2%Cu/Ti structure electrode showed about 27 times longer lifetime than that of Al-0.5%Cu IDT at an input power level of 31 dBm. The passivation layer effects on the power durability were examined by using SiO2, Si3N4, and AlN thin film layer. The 300 nm thick SiO2 layer suppressed the migration of aluminum and prevented from shorting out IDT electrodes effectively. The lifetime of SiO2-coated Al-2%Cu IDT could be about 30,000 hr at an input power level of 31 dBm.
Keywords
ladder filters; passivation; surface acoustic wave filters; AlCu; AlCu-Ti; AlN; IDT electrode; SAW duplexer; SAW ladder filter; Si3N4; SiO2; device lifetime; passivation layer; power durability; Aluminum alloys; Argon; Degradation; Electrodes; Frequency; Passivation; SAW filters; Sputtering; Surface acoustic waves; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location
Caesars Tahoe, NV
ISSN
1051-0117
Print_ISBN
0-7803-5722-1
Type
conf
DOI
10.1109/ULTSYM.1999.849351
Filename
849351
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