• DocumentCode
    2101758
  • Title

    Passivation layer effects on power durability of SAW duplexer

  • Author

    Jin Yong Kim ; Hyeong Joon Kim ; Hyun Min Cho ; Hyung Kook Yang ; Jong Chul Park

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Seoul Nat. Univ., South Korea
  • Volume
    1
  • fYear
    1999
  • fDate
    17-20 Oct. 1999
  • Firstpage
    39
  • Abstract
    The power durability of the ladder-type SAW filter was investigated with various electrode materials and passivation layers. Among the aluminum alloys, the Al-2%Cu electrode showed the longest lifetime. In addition, the Al-2%Cu/Ti structure electrode showed about 27 times longer lifetime than that of Al-0.5%Cu IDT at an input power level of 31 dBm. The passivation layer effects on the power durability were examined by using SiO2, Si3N4, and AlN thin film layer. The 300 nm thick SiO2 layer suppressed the migration of aluminum and prevented from shorting out IDT electrodes effectively. The lifetime of SiO2-coated Al-2%Cu IDT could be about 30,000 hr at an input power level of 31 dBm.
  • Keywords
    ladder filters; passivation; surface acoustic wave filters; AlCu; AlCu-Ti; AlN; IDT electrode; SAW duplexer; SAW ladder filter; Si3N4; SiO2; device lifetime; passivation layer; power durability; Aluminum alloys; Argon; Degradation; Electrodes; Frequency; Passivation; SAW filters; Sputtering; Surface acoustic waves; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Caesars Tahoe, NV
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-5722-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1999.849351
  • Filename
    849351