Title :
Lattice deformation in laser-shocked silicon single crystal studied by using picosecond time-resolved X-ray diffraction with laser plasma X-rays
Author :
Nakamura, K.G. ; Kishimura, H. ; Morishita, H. ; Okano, Y. ; Hironaka, Y. ; Atou, T. ; Kondo, K.
Author_Institution :
Tokyo Inst. of Technol., Yokohama
Abstract :
The transient lattice deformation of laser-shocked silicon single crystal was studied by picosecond time-resolved X-ray diffraction with laser plasma X-rays. The shock-recovered samples were evaluated by reciprocal space mapping.
Keywords :
X-ray diffraction; deformation; laser materials processing; silicon; time resolved spectra; Si; laser plasma X-rays; laser-shocked silicon single crystal; picosecond time-resolved X-ray diffraction; reciprocal space mapping; shock-recovered sample; transient lattice deformation; Delay effects; Laser beams; Lattices; Optical pulse generation; Plasma properties; Plasma x-ray sources; Pulse amplifiers; Silicon; X-ray diffraction; X-ray lasers;
Conference_Titel :
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
978-1-4244-0925-9
Electronic_ISBN :
1092-8081
DOI :
10.1109/LEOS.2007.4382460
