DocumentCode
2101796
Title
Lattice deformation in laser-shocked silicon single crystal studied by using picosecond time-resolved X-ray diffraction with laser plasma X-rays
Author
Nakamura, K.G. ; Kishimura, H. ; Morishita, H. ; Okano, Y. ; Hironaka, Y. ; Atou, T. ; Kondo, K.
Author_Institution
Tokyo Inst. of Technol., Yokohama
fYear
2007
fDate
21-25 Oct. 2007
Firstpage
425
Lastpage
426
Abstract
The transient lattice deformation of laser-shocked silicon single crystal was studied by picosecond time-resolved X-ray diffraction with laser plasma X-rays. The shock-recovered samples were evaluated by reciprocal space mapping.
Keywords
X-ray diffraction; deformation; laser materials processing; silicon; time resolved spectra; Si; laser plasma X-rays; laser-shocked silicon single crystal; picosecond time-resolved X-ray diffraction; reciprocal space mapping; shock-recovered sample; transient lattice deformation; Delay effects; Laser beams; Lattices; Optical pulse generation; Plasma properties; Plasma x-ray sources; Pulse amplifiers; Silicon; X-ray diffraction; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
Conference_Location
Lake Buena Vista, FL
ISSN
1092-8081
Print_ISBN
978-1-4244-0925-9
Electronic_ISBN
1092-8081
Type
conf
DOI
10.1109/LEOS.2007.4382460
Filename
4382460
Link To Document