Title :
Determination of neural state classification metrics from the power spectrum of human ECoG
Author :
Kelsey, M. ; Politte, D. ; Verner, R. ; Zempel, J.M. ; Nolan, T. ; Babajani-Feremi, A. ; Prior, F. ; Larson-Prior, Linda J.
Author_Institution :
Sch. of Med., Mallinckrodt Inst. of Radiol., Washington Univ., St. Louis, MO, USA
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Brain electrical activity exhibits scale-free dynamics that follow power law scaling. Previous works have shown that broadband spectral power exhibits state-dependent scaling with a log frequency exponent that systematically varies with neural state. However, the frequency ranges which best characterize biological state are not consistent across brain location or subject. An adaptive piecewise linear fitting solution was developed to extract features for classification of brain state. Performance was evaluated by comparison to an a posteriori based feature search method. This analysis, using the 1/f characteristics of the human ECoG signal, demonstrates utility in advancing the ability to perform automated brain state discrimination.
Keywords :
bioelectric phenomena; electroencephalography; feature extraction; medical signal processing; neurophysiology; signal classification; 1/f characteristics; a posteriori based feature search method; adaptive piecewise linear fitting solution; automated brain state discrimination; brain electrical activity; brain state; broadband spectral power; feature extraction; human ECoG signal; log frequency exponent; neural state; neural state classification metrics; power law scaling; scale-free dynamics; state-dependent scaling; Accuracy; Benchmark testing; Brain modeling; Educational institutions; Feature extraction; Humans; Sleep; Algorithms; Brain; Brain Mapping; Diagnosis, Computer-Assisted; Electroencephalography; Humans; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity; Wakefulness;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346926