Title :
Device Research Conference (IEEE Cat. No.04TH8724)
Abstract :
The following topics are dealt with: silicon device scaling; wide bandgap devices; carbon nanotube devices; device modeling; III-V FET and bipolar transistors; HEMTs; MOSFETs; memory devices; optical sources and detectors; organic semiconductors; plastic electronics; quantum-effect and single-electron devices; reliability; sensors; thin film transistors; tunneling devices; photonic devices; LEDs; laser diodes; photodiodes; HBTs.
Keywords :
III-V semiconductors; MOSFET; bipolar transistors; electric sensing devices; field effect transistors; heterojunction bipolar transistors; high electron mobility transistors; light emitting diodes; nanotube devices; organic semiconductors; photodiodes; quantum optics; semiconductor device models; semiconductor device reliability; semiconductor lasers; semiconductor storage; single electron devices; thin film transistors; tunnelling; wide band gap semiconductors; FET; HBT; HEMT; III-V transistors; LED; MOSFET; bipolar transistors; carbon nanotube devices; device modeling; laser diodes; memory devices; optical detectors; optical sources; organic semiconductors; photodiodes; photonic devices; plastic electronics; quantum-effect devices; reliability; sensors; silicon device scaling; single-electron devices; thin film transistors; tunneling devices; wide bandgap devices;
Conference_Titel :
Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
Conference_Location :
Notre Dame, IN, USA
Print_ISBN :
0-7803-8284-6
DOI :
10.1109/DRC.2004.1367743
