DocumentCode :
2101933
Title :
Imaging surface acoustic waves on GaAs by X-ray diffraction techniques
Author :
Sauer, W. ; Streibl, M. ; Metzger, T.H. ; Haubrich, A.G.C. ; Manus, S. ; Wixforth, Achim ; Peisl, J. ; Mazuelas, A. ; Haertwig, J. ; Baruchel, J.
Author_Institution :
Sektion Phys., Ludwig-Maximilians-Univ., Munchen, Germany
Volume :
1
fYear :
1999
fDate :
17-20 Oct. 1999
Firstpage :
69
Abstract :
Surface acoustic waves (SAWs) are excited on the GaAs (001) surface by using interdigital transducers, designed for frequencies of up to 900 MHz. The emitted surface phonons with wave-lengths down to 3.5 μm are visualized and characterized by combined x-ray diffraction techniques. By increasing the amplitude of the SAW, high resolution x-ray diffraction profiles show up to 12 phonon-induced satellite reflections besides the GaAs (004) reflection with a width of 9 arcsec each. The diffraction pattern is simulated numerically, applying the kinematical scattering theory to a model crystal of a size adapted to the experimental situation. From fits to measured diffraction profiles at different excitation voltages, the SAW amplitudes were calculated and found to be in the sub-nm range. Using stroboscopic topography, the SAW emission of a focusing transducer geometry is imaged.
Keywords :
III-V semiconductors; X-ray diffraction; X-ray topography; gallium arsenide; interdigital transducers; surface acoustic wave transducers; surface acoustic waves; surface phonons; 900 MHz; GaAs; GaAs (001) substrate; X-ray diffraction; focusing transducer; interdigital transducer; kinematical scattering; stroboscopic topography; surface acoustic wave imaging; surface phonon; Acoustic diffraction; Acoustic imaging; Acoustic waves; Gallium arsenide; Optical imaging; Reflection; Surface acoustic waves; Surface topography; X-ray diffraction; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849358
Filename :
849358
Link To Document :
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