Title :
Phase Gradient Autofocus for SAR Phase Correction: Explanation and Demonstration of Algorithmic Steps
Author :
Eichel, P.H. ; Ghiglia, D.C. ; Jakowatz, C.V., Jr. ; Wahl, D.E.
Author_Institution :
Sandia National Laboratories, Albuquerque, NM
Keywords :
Algorithm design and analysis; Diffraction; Electronics packaging; Focusing; Image restoration; Intellectual property; Laboratories; Layout; National electric code; Signal processing algorithms;
Conference_Titel :
Digital Signal Processing workshop, 1992. The
DOI :
10.1109/DSPWS.1992.665579