Title : 
A wideband sampling voltmeter
         
        
            Author : 
Souders, T.M. ; Waltrip, B.C. ; Laug, O.B. ; Deyst, J.P.
         
        
            Author_Institution : 
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
         
        
        
        
        
        
            Abstract : 
A high accuracy sampling voltmeter, designed to span the frequency range of 10 Hz to 200 MHz, is described. The instrument operates autonomously, at a measurement update rate of at least one per second. A novel quasi-equivalent time sampling process is used, with a custom strobed comparator as the sampling device and decision element. The architecture and control are presented, along with the time-base design principles. Major error sources associated with the time-base are also discussed
         
        
            Keywords : 
circuit feedback; comparators (circuits); computerised instrumentation; digital-analogue conversion; jitter; measurement errors; quantisation (signal); signal sampling; time bases; voltmeters; wave analysers; waveform analysis; 10 Hz to 200 MHz; DAC; Markov algorithm; autonomous instrument; custom strobed comparator; decision element; error sources; high accuracy; linearity errors; quantisation; quasi-equivalent time sampling process; sampler control; strobed comparator; successive approximation feedback loop; time-base design principles; timing jitter; truncation errors; wideband sampling voltmeter; Current measurement; Error correction; Frequency measurement; Gain measurement; Integrated circuit measurements; Quantization; Sampling methods; Signal resolution; Voltmeters; Wideband;
         
        
        
        
            Conference_Titel : 
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
         
        
            Conference_Location : 
Brussels
         
        
            Print_ISBN : 
0-7803-3312-8
         
        
        
            DOI : 
10.1109/IMTC.1996.507550