Title :
A new symbolic approach to the fault diagnosis of analog circuits
Author :
Catelani, M. ; Fedi, G. ; Giraldi, S. ; Luchetta, A. ; Manetti, S. ; Piccirilli, M.C.
Author_Institution :
Dept. of Electron. Eng., Florence Univ., Italy
Abstract :
A new approach for the fault diagnosis of analog circuit is presented. Particular attention is given to the uncertainty propagation in the measurement process in order to locate and identify the faulty element causing the failure of the circuit under test. The proposed procedure is based on the use of symbolic techniques which allows to implement a fully automated fault diagnosis system with a strongly reduced computational complexity and an increasing computing speed with respect to a completely numerical approach
Keywords :
analogue circuits; automatic test software; circuit analysis computing; circuit testing; computational complexity; design for testability; fault diagnosis; polynomials; symbol manipulation; uncertainty handling; SAPEC package; algorithm; analog circuits; circuit under test; component tolerance; fault diagnosis; fully automated diagnosis system; increasing computing speed; linear circuit; network function; notch filter; strongly reduced computational complexity; symbolic approach; uncertainty propagation; Analog circuits; Circuit analysis; Circuit faults; Circuit testing; Fault diagnosis; Frequency;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
DOI :
10.1109/IMTC.1996.507558
