Title :
Scale normalization of histopathological images for batch invariant cancer diagnostic models
Author :
Kothari, Sonal ; Phan, John H. ; Wang, May Dongmei
Author_Institution :
Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA, USA
fDate :
Aug. 28 2012-Sept. 1 2012
Abstract :
Histopathological images acquired from different experimental set-ups often suffer from batch-effects due to color variations and scale variations. In this paper, we develop a novel scale normalization model for histopathological images based on nuclear area distributions. Results indicate that the normalization model closely fits empirical values for two renal tumor datasets. We study the effect of scale normalization on classification of renal tumor images. Scale normalization improves classification performance in most cases. However, performance decreases in a few cases. In order to understand this, we propose two methods to filter extracted image features that are sensitive to image scaling and features that are uncorrelated with scaling factor. Feature filtering improves the classification performance of cases that were initially negatively affected by scale normalization.
Keywords :
biomedical optical imaging; cancer; feature extraction; filtering theory; image classification; image colour analysis; medical image processing; tumours; batch invariant cancer diagnostic models; color variations; histopathological image acquisition; image feature extraction filter; image scaling; nuclear area distributions; optical imaging; renal tumor datasets; renal tumor image classification; scale normalization; Cancer; Feature extraction; Filtering; Image color analysis; Image segmentation; Standards; Tumors; Algorithms; Biopsy; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Kidney Neoplasms; Pattern Recognition, Automated; Reference Values; Reproducibility of Results; Sensitivity and Specificity;
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location :
San Diego, CA
Print_ISBN :
978-1-4244-4119-8
Electronic_ISBN :
1557-170X
DOI :
10.1109/EMBC.2012.6346943