DocumentCode
2102418
Title
A new ROC analysis method considering the correlation between neighboring pixels
Author
Xin Liu ; Yetik, I.S.
Author_Institution
Med. Imaging Res. Center, Illinois Inst. of Technol., Chicago, IL, USA
fYear
2012
fDate
Aug. 28 2012-Sept. 1 2012
Firstpage
4422
Lastpage
4425
Abstract
In this paper, we introduce a novel receiver operating characteristic (ROC) analysis method that considers spatial correlation between pixels to evaluate classification algorithms. ROC analysis is one of the most important tools in the evaluation of medical images and computer aided diagnosis (CAD) systems. It provides a comprehensive description of the detection accuracy of the test image. To evaluate the localization performance, operating points of ROC curves are obtained based on the classification results of individual pixels. To this date, the confidence level or intensity value of each pixel is assumed to be independent within the image. However, this assumption is not satisfied in real problems. In this paper, a new ROC analysis algorithm that considers the correlation between neighboring pixels is proposed. Our results show that the new ROC curves provide a more accurate evaluation of the test image.
Keywords
correlation methods; medical image processing; sensitivity analysis; CAD system; ROC analysis; computer aided diagnosis; detection accuracy; localization performance; medical images; neighboring pixels correlation; pixel confidence level; pixel intensity value; receiver operating characteristic analysis; spatial correlation; Algorithm design and analysis; Biomedical imaging; Correlation; Design automation; Receivers; Solid modeling; ROC analysis; image evaluation; spatial correlation; Algorithms; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Pattern Recognition, Automated; ROC Curve; Reproducibility of Results; Sensitivity and Specificity; Statistics as Topic;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2012 Annual International Conference of the IEEE
Conference_Location
San Diego, CA
ISSN
1557-170X
Print_ISBN
978-1-4244-4119-8
Electronic_ISBN
1557-170X
Type
conf
DOI
10.1109/EMBC.2012.6346947
Filename
6346947
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