DocumentCode :
2102788
Title :
Surface acoustic wave propagation properties of 3C-SiC epitaxial films on Si(100)
Author :
Jin Yong Kim ; Hoon Joo Na ; Hyeong Joon Kim
Author_Institution :
Sch. of Mater. Sci. & Eng., Seoul Nat. Univ., South Korea
Volume :
1
fYear :
1999
fDate :
17-20 Oct. 1999
Firstpage :
273
Abstract :
3C-SiC epitaxial films on Si(100) were successfully grown by MOCVD using BTMSM source. The FWHM of 3C-SiC (200) peak was obtained 0.37 degree. Using ZnO piezoelectric thin films, the SAW propagation properties of 3C-SiC thin films on Si(100) have been experimentally and theoretically investigated. The hard 3C-SiC thin films stiffened the Si substrate so that the velocities of fundamental and 1st modes increased up to 5,100 m/s and 9,140 m/s, respectively.
Keywords :
MOCVD; Rayleigh waves; acoustic wave propagation; semiconductor thin films; silicon compounds; stacking faults; surface acoustic wave filters; surface acoustic waves; 3C-SiC epitaxial films; BTMSM source; MOCVD; SAW filter; Sezawa mode; Si; Si(100) substrates; SiC; piezoelectric thin films; stacking faults; surface acoustic wave propagation; Acoustic propagation; Acoustic waves; Frequency; Piezoelectric films; SAW filters; Semiconductor thin films; Substrates; Surface acoustic wave devices; Surface acoustic waves; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
Conference_Location :
Caesars Tahoe, NV
ISSN :
1051-0117
Print_ISBN :
0-7803-5722-1
Type :
conf
DOI :
10.1109/ULTSYM.1999.849401
Filename :
849401
Link To Document :
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