Title :
Failure analysis tailored to demand a business model for high tech service
Author_Institution :
Infineon. Technol. AG, Munich
Abstract :
This paper is an approach to establish a complete business model for failure analysis (FA) as a high tech service provider in the world of microelectronics, from the introduction of analysis process flows, over correlation of equipment/skills with the technologies and products that the lab is supporting, to a key performance indicators (KPI)-based operation that handles the interdependencies of workload and cycle time and opens the path to quantitative target setting agreements with the customer´s inclusive introduction into balanced score card controlling. A complete system, built upon all the presented parts, leads to a database that can calculate all the parameters for an FA lab from scratch, tailored exactly to the demand of the customer. Such a database acts as reference lab and defines best FA practice.
Keywords :
failure analysis; integrated circuit reliability; integrated circuit testing; integrated circuit yield; planning; FA lab; KPI-based operation; analysis process flows; balanced score card controlling; best FA practice; customer demand tailored system; database parameters; equipment/skills correlation; failure analysis business model; high tech service provider; key performance indicators-based operation; microelectronics technologies; product support; quantitative target setting agreements; reference lab; workload/cycle time interdependencies; Costs; Databases; Electronics industry; Failure analysis; Feedback; Investments; Knowledge engineering; Manufacturing processes; Microelectronics; Process control;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2002. IPFA 2002. Proceedings of the 9th International Symposium on the
Print_ISBN :
0-7803-7416-9
DOI :
10.1109/IPFA.2002.1025603