• DocumentCode
    2102955
  • Title

    Influence of the access resistance in the rf performance of mm-wave AlGaN/GaN HEMTs

  • Author

    Palacios, T. ; Rajan, S. ; Shen, L. ; Chakraborty, A. ; Heikman, S. ; Keller, S. ; DenBaars, S.P. ; Mishra, U.K.

  • Author_Institution
    ECE Dept., California Univ., Santa Barbara, CA, USA
  • fYear
    2004
  • fDate
    21-23 June 2004
  • Firstpage
    75
  • Abstract
    After demonstrating impressive performance in the X-band frequencies, one of the next goals for GaN-based power transistors is to increase the frequency of operation to the mm-wave range. Monte Carlo simulations predict that the saturation electron velocity in AlGaN/GaN high electron mobility transistors (HEMTs) should be around 2.5×107 cm/s (M. Singh and J. Singh, J. Appl. Phys. vol. 94, p. 2498, 2003). The study of fT vs IDS from pinch-off to saturation is a very useful tool to understand the maximum frequency performance of mm-wave HEMTs. In this work, we have studied the effect of parasitic resistances in the shape of the fT vs IDS curve. Rs increases with the current density in the channel. The extraction of the effect of the differential access resistance out of fT greatly changes the shape of the curve. The access resistances play an important role in the rf behavior of AlGaN/GaN transistors. Not only the absolute values, but also their increase with current must be controlled in order to get the maximum performance out of the GaN-based HEMTs.
  • Keywords
    III-V semiconductors; aluminium compounds; current density; electric resistance; gallium compounds; millimetre wave field effect transistors; power HEMT; semiconductor device testing; wide band gap semiconductors; AlGaN-GaN; GaN-based power transistors; Monte Carlo simulations; access resistance; channel current density; differential access resistance; maximum frequency performance; mm-wave AlGaN/GaN HEMT; parasitic resistances; pinch-off; rf performance; saturation frequency; Aluminum gallium nitride; Delay; Electrons; Gallium nitride; HEMTs; Intrusion detection; MODFETs; Radio frequency; Shape; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
  • ISSN
    1548-3770
  • Print_ISBN
    0-7803-8284-6
  • Type

    conf

  • DOI
    10.1109/DRC.2004.1367790
  • Filename
    1367790