DocumentCode
2102955
Title
Influence of the access resistance in the rf performance of mm-wave AlGaN/GaN HEMTs
Author
Palacios, T. ; Rajan, S. ; Shen, L. ; Chakraborty, A. ; Heikman, S. ; Keller, S. ; DenBaars, S.P. ; Mishra, U.K.
Author_Institution
ECE Dept., California Univ., Santa Barbara, CA, USA
fYear
2004
fDate
21-23 June 2004
Firstpage
75
Abstract
After demonstrating impressive performance in the X-band frequencies, one of the next goals for GaN-based power transistors is to increase the frequency of operation to the mm-wave range. Monte Carlo simulations predict that the saturation electron velocity in AlGaN/GaN high electron mobility transistors (HEMTs) should be around 2.5×107 cm/s (M. Singh and J. Singh, J. Appl. Phys. vol. 94, p. 2498, 2003). The study of fT vs IDS from pinch-off to saturation is a very useful tool to understand the maximum frequency performance of mm-wave HEMTs. In this work, we have studied the effect of parasitic resistances in the shape of the fT vs IDS curve. Rs increases with the current density in the channel. The extraction of the effect of the differential access resistance out of fT greatly changes the shape of the curve. The access resistances play an important role in the rf behavior of AlGaN/GaN transistors. Not only the absolute values, but also their increase with current must be controlled in order to get the maximum performance out of the GaN-based HEMTs.
Keywords
III-V semiconductors; aluminium compounds; current density; electric resistance; gallium compounds; millimetre wave field effect transistors; power HEMT; semiconductor device testing; wide band gap semiconductors; AlGaN-GaN; GaN-based power transistors; Monte Carlo simulations; access resistance; channel current density; differential access resistance; maximum frequency performance; mm-wave AlGaN/GaN HEMT; parasitic resistances; pinch-off; rf performance; saturation frequency; Aluminum gallium nitride; Delay; Electrons; Gallium nitride; HEMTs; Intrusion detection; MODFETs; Radio frequency; Shape; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference, 2004. 62nd DRC. Conference Digest [Includes 'Late News Papers' volume]
ISSN
1548-3770
Print_ISBN
0-7803-8284-6
Type
conf
DOI
10.1109/DRC.2004.1367790
Filename
1367790
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