DocumentCode :
2103902
Title :
A circle fitting procedure using semi-parametric modelling: Toward an improved sliding load calibration procedure
Author :
Vandersteen, Gerd ; Schoukens, Johan ; Rolain, Yves ; Verschueren, Ann
Author_Institution :
Vrije Univ., Brussels, Belgium
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1254
Abstract :
Circle fitting problems often occur in microwave engineering when dealing with variable delays (e.g. calibration using a sliding load). In this paper an efficient semi-parametric circle fitting procedure is proposed which takes into account the phase relationships over the frequencies. It produces more accurate results by the parsimonious principle, requires less measurements and is more robust to the settings of the positions of the sliding load than the nonparametric model [1]. Using the variance of the estimates, optimal position settings are proposed together with a statistically based validation technique to detect systematic errors with respect to the circle model. The performance of the proposed method is illustrated on sliding load measurements up to 50 GHz, illustrating that the accuracy of the semi-parametric method using 3 positions is comparable to the nonparametric method with 6 positions
Keywords :
calibration; curve fitting; delays; error analysis; measurement errors; microwave measurement; network analysers; statistical analysis; 50 GHz; circle fitting; circle model; microwave engineering; microwave measurement; network analysers; nonparametric model; optimal position settings; optimal positions; parsimonious principle; phase relationships; semiparametric modelling; sliding load calibration; statistically based validation; systematic errors; variable delays; Calibration; Delay; Frequency; Impedance measurement; Microwave measurements; Position measurement; Reflection; Robustness; Telephony; Transmission lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507572
Filename :
507572
Link To Document :
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