Behavior of Ag and ZnO thin films, deposited by thermal evaporation technique, as an optical filter

Author

Dwivedi, V.K. ; Misra, K.P. ; Srivastava, Anurag ; Shukla, Ram Krishan ; Srivastava, Anurag

Author_Institution

Dept. of Phys., Univ. of Lucknow, Lucknow

fYear

2008

fDate

22-24 Dec. 2008

Firstpage

295

Lastpage

298

Abstract

Interference filters are multilayer thin-film devices in which thin :layers of material have a thickness of the order of wavelength of light. Thin films of dielectrics as well as metals have been nice candidates for the purpose of interference filters for a long time. In the present paper thin films of silver and zinc oxide have been deposited by thermal evaporation technique on the glass substrate. The optical transmittance of these films as well as combinations of these films has been investigated thoroughly in the visible and near infrared region.

Keywords

II-VI semiconductors; infrared spectra; interference filters; metallic thin films; optical multilayers; semiconductor thin films; semiconductor-metal boundaries; silver; vacuum deposition; visible spectra; wide band gap semiconductors; zinc compounds; Ag; Ag-ZnO; SiO₂; ZnO; glass substrate; interference filters; near infrared transmittance; optical filter; optical transmittance; silver thin films; thermal evaporation technique; visible transmittance; zinc oxide thin films; Dielectric materials; Dielectric substrates; Dielectric thin films; Interference; Nonhomogeneous media; Optical films; Optical filters; Sputtering; Thin film devices; Zinc oxide; Ag; Interference Filter; Transmittance; ZnO;

fLanguage

English

Publisher

ieee

Conference_Titel

Advanced Optoelectronic Materials and Devices, 2008. AOMD 2008. 2nd National Workshop on

Conference_Location

Varanasi

Print_ISBN

978-0-230-63718-4

Type

conf

Filename

5075721