DocumentCode :
2104299
Title :
Evaluation of analog to digital conversion error for wideband signals
Author :
Muginov, Galia D. ; Venetsanopoulos, Anastasios N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1308
Abstract :
One of the most significant types of error in Digital Signal Processing (DSP) systems working with wideband signals is the error introduced by the Analog-to-Digital Converter (ADC). This paper investigates an accurate, simple and low cost method, which can be used for calibrating, testing and quick monitoring ADC. The proposed method analyzes the deviation of a value of the converted signal, which is similar to the ADC working signal, from its true value. The deviation represents the tested ADC error evaluated for both frequency and voltage ranges of ADC operations using statistical data processing. It gives the only necessary ADC accuracy characteristic to a user leaving the rest to the designer. Comparisons between the proposed ADC testing approach and the known techniques are provided. The errors incurred by the method are analyzed. A special source of random signal with controlled statistical parameters and its calibration technique are also described
Keywords :
analogue-digital conversion; calibration; error statistics; integrated circuit testing; signal sampling; ADC accuracy characteristic; ADC testing; algorithm; analog to digital conversion error; calibration; differential linearity; gain error; global strategy; integral linearity; low cost method; minimum sample size; random signal; statistical data processing; transfer characteristics; wideband signals; zero error; Analog-digital conversion; Costs; Digital signal processing; Frequency; Monitoring; Signal analysis; Signal processing; Testing; Voltage; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507583
Filename :
507583
Link To Document :
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