• DocumentCode
    2104386
  • Title

    Ultrasonic microscopy using low frequency transducers

  • Author

    Demirli, Ramazan ; Saniie, Jafar

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
  • Volume
    1
  • fYear
    1999
  • fDate
    17-20 Oct. 1999
  • Firstpage
    589
  • Abstract
    Ultrasonic microscopy that mainly concerns itself with depth profiling and characterizing thin layers relies on not only the resolution of the transducer impulse response but also the frequency characterization of propagation paths. The frequency dependent absorption and scattering limits the use of high frequency transducers for improved resolution, detection, and characterization. The information obtained from low frequency transducers is significantly concealed, and not readily resolvable but can be improved by deconvolving the transducer impulse echo from the backscattered echoes. In this study, we adaptively estimate the echo wavelets and their arrival times directly from the experimental measurement using echo models. The estimation of model parameters is addressed using the SAGE algorithm. The model order selection is carried out using the Minimum Description Length (MDL) principle. We have observed that the model-based estimation significantly improves the accuracy and resolution of echo location and amplitude when compared to conventional techniques such as the Wiener Filter and Pseudoinverse solution.
  • Keywords
    acoustic microscopy; backscatter; ultrasonic measurement; ultrasonic scattering; ultrasonic transducers; SAGE algorithm; arrival times; backscattered echoes; depth profiling; echo wavelets; frequency characterization; frequency dependent absorption; frequency dependent scattering; high frequency transducers; low frequency transducers; minimum description length principle; propagation paths; resolution; transducer impulse echo; transducer impulse response; ultrasonic microscopy; Absorption; Amplitude estimation; Convergence; Deconvolution; Frequency dependence; Microscopy; Parameter estimation; Scattering; Ultrasonic transducers; Wiener filter;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1999. Proceedings. 1999 IEEE
  • Conference_Location
    Caesars Tahoe, NV
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-5722-1
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1999.849468
  • Filename
    849468