Title :
A single six-port reflectometer measures the scattering parameters of two- port microwave devices
Author :
de Oliveira, Antonio Jeronimo Belfort ; Neto, Sergio Pedro Xavier
Author_Institution :
Departamento de Eletronica e Sistemas, Centro de Tecnologia, Universidade Federal de Pernambuco, Cidade Universitaria, Recife, Pernambuco, Brasil. Fax: 081-2718215, Email: belfort@npd.ufpe.br
Abstract :
A single six-port reflectometer configuration is here proposed to measure the four scattering parameters of two-port microwave devices. In order to determine the transmission coefficients, only one calibration standard and three measurements are required to complete calibration procedure. Furthermore, S12 and S21 can be measured without reversing the device under test.
Keywords :
Calibration; Circuits; Isolators; Microwave devices; Microwave measurements; Reflection; Scattering parameters; Switches; Testing; Transmission line measurements;
Conference_Titel :
Microwave Conference, 1995. 25th European
Conference_Location :
Bologna, Italy
DOI :
10.1109/EUMA.1995.336979
