• DocumentCode
    2104745
  • Title

    Measurement parameter optimization for surface crack detection in metals using an open-ended waveguide probe

  • Author

    Zoughi, Reza ; Ganchev, Stoyan I. ; Huber, Christian

  • Author_Institution
    Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
  • Volume
    2
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    1391
  • Abstract
    Fatigue and stress induced surface crack detection in metals is an important practical issue. A newly developed microwave inspection approach, using an open-ended rectangular waveguide, has proved to be an effective tool for detecting such cracks. This novel microwave approach overcomes some of the limitations associated with the standard detection methods for surface crack detection. In addition, this approach is applicable to exposed, filled (with a dielectric such as dirt, rust, etc.) and cracks under dielectric coatings such as paint. This paper presents the basic foundation of this surface crack detection methodology along with the ways by which measurement parameters may be optimized for increased detection sensitivity
  • Keywords
    crack detection; electric sensing devices; inspection; metals; microwave measurement; nondestructive testing; probes; waveguide components; Al; covered cracks; detection sensitivity; dielectrics; dirt; fatigue; filled cracks; measurement parameter optimization; metals; microwave inspection; open-ended rectangular waveguide; open-ended waveguide probe; optimisation; rust; steel; stress; surface crack detection; Coatings; Dielectric measurements; Fatigue; Inspection; Microwave theory and techniques; Optimization methods; Paints; Rectangular waveguides; Stress; Surface cracks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
  • Conference_Location
    Brussels
  • Print_ISBN
    0-7803-3312-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1996.507600
  • Filename
    507600