DocumentCode :
2104745
Title :
Measurement parameter optimization for surface crack detection in metals using an open-ended waveguide probe
Author :
Zoughi, Reza ; Ganchev, Stoyan I. ; Huber, Christian
Author_Institution :
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1391
Abstract :
Fatigue and stress induced surface crack detection in metals is an important practical issue. A newly developed microwave inspection approach, using an open-ended rectangular waveguide, has proved to be an effective tool for detecting such cracks. This novel microwave approach overcomes some of the limitations associated with the standard detection methods for surface crack detection. In addition, this approach is applicable to exposed, filled (with a dielectric such as dirt, rust, etc.) and cracks under dielectric coatings such as paint. This paper presents the basic foundation of this surface crack detection methodology along with the ways by which measurement parameters may be optimized for increased detection sensitivity
Keywords :
crack detection; electric sensing devices; inspection; metals; microwave measurement; nondestructive testing; probes; waveguide components; Al; covered cracks; detection sensitivity; dielectrics; dirt; fatigue; filled cracks; measurement parameter optimization; metals; microwave inspection; open-ended rectangular waveguide; open-ended waveguide probe; optimisation; rust; steel; stress; surface crack detection; Coatings; Dielectric measurements; Fatigue; Inspection; Microwave theory and techniques; Optimization methods; Paints; Rectangular waveguides; Stress; Surface cracks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507600
Filename :
507600
Link To Document :
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