DocumentCode
2104745
Title
Measurement parameter optimization for surface crack detection in metals using an open-ended waveguide probe
Author
Zoughi, Reza ; Ganchev, Stoyan I. ; Huber, Christian
Author_Institution
Dept. of Electr. Eng., Colorado State Univ., Fort Collins, CO, USA
Volume
2
fYear
1996
fDate
1996
Firstpage
1391
Abstract
Fatigue and stress induced surface crack detection in metals is an important practical issue. A newly developed microwave inspection approach, using an open-ended rectangular waveguide, has proved to be an effective tool for detecting such cracks. This novel microwave approach overcomes some of the limitations associated with the standard detection methods for surface crack detection. In addition, this approach is applicable to exposed, filled (with a dielectric such as dirt, rust, etc.) and cracks under dielectric coatings such as paint. This paper presents the basic foundation of this surface crack detection methodology along with the ways by which measurement parameters may be optimized for increased detection sensitivity
Keywords
crack detection; electric sensing devices; inspection; metals; microwave measurement; nondestructive testing; probes; waveguide components; Al; covered cracks; detection sensitivity; dielectrics; dirt; fatigue; filled cracks; measurement parameter optimization; metals; microwave inspection; open-ended rectangular waveguide; open-ended waveguide probe; optimisation; rust; steel; stress; surface crack detection; Coatings; Dielectric measurements; Fatigue; Inspection; Microwave theory and techniques; Optimization methods; Paints; Rectangular waveguides; Stress; Surface cracks;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location
Brussels
Print_ISBN
0-7803-3312-8
Type
conf
DOI
10.1109/IMTC.1996.507600
Filename
507600
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