Fast and accurate ADC testing via an enhanced sine wave fitting algorithm

Author

Giaquinto, N. ; Trotta, A.

Author_Institution

Dept. of Electr. & Electron., Polytech. of Bari, Italy

Volume

2

fYear

1996

fDate

1996

Firstpage

1413

Abstract

A new sine-wave fitting algorithm for A/D converters testing is presented and discussed. The key feature of the algorithm is the possibility of using test signals with amplitude greater than the full-scale range of the device under test. The new technique, combined with an improved evaluation of the conversion noise via weighted mean square error, gives very accurate and repeatable estimates of the number of effective bits, which cannot be obtained by traditional methodologies. The performance of the new method is proved by means of computer simulations and experimental results as well

Keywords

analogue-digital conversion; automatic testing; circuit analysis computing; circuit testing; curve fitting; digital simulation; parameter estimation; A/D converters testing; ADC testing; computer simulation; conversion noise; enhanced sine wave fitting algorithm; estimates; test signals; weighted mean square error; Analog-digital conversion; Computer simulation; Electronic equipment testing; Histograms; Legged locomotion; Mean square error methods; Performance evaluation; Signal to noise ratio; System testing; Transfer functions;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE

Conference_Location

Brussels

Print_ISBN

0-7803-3312-8

Type

conf

DOI

10.1109/IMTC.1996.507604

Filename

507604