• DocumentCode
    2104957
  • Title

    Probabilistic Static Voltage Stability Security Assessment for Power Transmission System

  • Author

    Wang, Dongtao ; Yu, Yixin

  • Author_Institution
    Dept. of Autom. & Electr. Eng., Tianjin Univ. of Technol. & Educ., Tianjin, China
  • fYear
    2010
  • fDate
    28-31 March 2010
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A probabilistic static voltage stability security assessment model based on stochastic load flow (SLF) and static voltage stability region in cut-set space (CVSR) is presented. Uncertainties in loads and generation power injections, probabilities of critical contingencies can be considered in the model. The probabilistic distribution functions (PDFs) of line flows of key cut-set are obtained by stochastic load flow, and the PDFs of linear combination of line flows in CVSR are deduced by Gram-Charlier progression and Cumulants. Then the probability of static voltage instability is calculated by hyperplane equation of CVSR. By analysis of probability index, faults making the most contribution to the system static voltage insecurity probability are obtained. The results of probabilistic static voltage stability security assessment can be applied in making decision of preventive control. Test results on the New England 10-genarator 39-bus system are presented and the effectiveness of this approach has been proved.
  • Keywords
    power system security; power system stability; stochastic processes; transmission networks; critical contingencies; generation power injections; linear combination; power transmission system; probabilistic distribution functions; probabilistic static voltage stability security assessment; probability index; stochastic load flow; Distribution functions; Load flow; Power generation; Power system modeling; Power system security; Power transmission; Stability; Stochastic processes; Uncertainty; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power and Energy Engineering Conference (APPEEC), 2010 Asia-Pacific
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-4812-8
  • Electronic_ISBN
    978-1-4244-4813-5
  • Type

    conf

  • DOI
    10.1109/APPEEC.2010.5448896
  • Filename
    5448896