DocumentCode :
2105022
Title :
Sinewave fit algorithm based on total least-squares method
Author :
Zhang, J.Q. ; Xinmin, Zhao ; Jinwei, Sun ; Xiao, Hu
Author_Institution :
Dept. of Electr. Eng., Harbin Inst. of Technol., China
Volume :
2
fYear :
1996
fDate :
1996
Firstpage :
1436
Abstract :
Sinewave fit is a fundamental task in many test and measurement systems. The characterizations of analog-digital converter and digital oscilloscopes are two examples. In this paper we present a high performance (i.e. high precision and high speed) algorithm to estimate the four parameters of a sine-wave from a sample data record. Making use of trigonometric identity, we propose a frequency estimator that turns the nonlinear estimation problem into a linear one. Thus, the difficulty of the traditional nonlinear least squares sinewave fit method is attenuated. The total least squares method Is used to estimate four parameters of a sinewave in order to make the estimation errors be minimum in the sense of l2 norm. Simulation results exhibit that the proposed method gives superior performance over traditional ones. This new algorithm is noniterative and gives swift and consistent results
Keywords :
amplitude estimation; analogue-digital conversion; curve fitting; frequency estimation; least squares approximations; phase estimation; signal sampling; amplitude estimation; analog-digital converter; digital oscilloscope; frequency estimator; high performance algorithm; high precision algorithm; high speed algorithm; minimum estimation errors; offset estimation; parameter estimation; phase estimation; sample data record; simulation; sinewave fit algorithm; total least-squares method; trigonometric identity; Analog-digital conversion; Convergence; Equations; Frequency estimation; Integrated circuit noise; Least squares approximation; Least squares methods; Oscilloscopes; Parameter estimation; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
Conference_Location :
Brussels
Print_ISBN :
0-7803-3312-8
Type :
conf
DOI :
10.1109/IMTC.1996.507608
Filename :
507608
Link To Document :
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