• DocumentCode
    2106119
  • Title

    A new noise parameter measurement method for microwave devices

  • Author

    Bareau, P. ; Abdipour, A. ; Pacaud, A

  • Author_Institution
    Service Radioelectricite et Electron., Ecole Superieure d´´Electr., Gif-sur-Yvette, France
  • Volume
    2
  • fYear
    1996
  • fDate
    1996
  • Firstpage
    1502
  • Abstract
    This paper proposes a new method for noise parameter measurement of microwave devices. Instead of measuring the noise figure, the optimum source impedance Γopt is determined by measuring the noise powers corresponding to cold impedances, then the minimum noise figure Fmin (or minimum effective noise temperature Tmin ) and noise conductance Gn are determined by connecting a calibrated hot noise source. Measurements corresponding to the largest possible range of the source impedance coefficient are possible (0⩽Γ⩽1), which is not the case for the classical method. Automatic tuner and isolators used in the classical method are no longer necessary. Using our method, the noise measurement system cost will be reduced and the measurement time will also be minimized
  • Keywords
    electric noise measurement; impedance matching; microwave devices; microwave measurement; calibrated hot noise source; cold impedances; microwave devices; minimised measurement time; minimum noise figure; multifrequency measurements; noise conductance; noise parameter measurement method; noise powers; noise temperature; optimum source impedance; parameter extraction algorithm; reduced measurement system cost; source impedance coefficient; two-port device; Impedance measurement; Joining processes; Microwave devices; Microwave measurements; Microwave theory and techniques; Noise figure; Noise measurement; Optimized production technology; Temperature; Tuners;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1996. IMTC-96. Conference Proceedings. Quality Measurements: The Indispensable Bridge between Theory and Reality., IEEE
  • Conference_Location
    Brussels
  • Print_ISBN
    0-7803-3312-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1996.507620
  • Filename
    507620