• DocumentCode
    2106363
  • Title

    The sample complexity of worst-case identification of FIR linear systems

  • Author

    Dahleh, Munther A. ; Theodosopoulos, Theodore V. ; Tsitsiklis, John N.

  • Author_Institution
    Lab. for Inf. & Decision Syst., MIT, Cambridge, MA, USA
  • fYear
    1993
  • fDate
    15-17 Dec 1993
  • Firstpage
    2082
  • Abstract
    We consider the problem of identification of linear systems in the presence of measurement noise which is unknown but bounded in magnitude by some δ>0. We focus on the case of linear systems with a finite impulse response (FIR). It is known that the optimal identification error is related (within a factor of 2) to the diameter of a so-called uncertainty set and that the latter diameter is upper-bounded by 2δ, if a sufficiently long identification experiment is performed. If the identification error is measured with respect to the l1 norm, we establish that, for any K⩾1, the minimal length of an identification experiment that is guaranteed to lead to a diameter bounded by 2Kδ behaves like 2Nf(1/K), when N is large, where N is the length of the impulse response and f is a positive function known in closed form. We contrast this with identification in H, where an experiment of length O(N3) suffices. While the framework is entirely deterministic, our results are proved using probabilistic tools
  • Keywords
    computational complexity; error analysis; identification; linear systems; noise; optimisation; transient response; FIR linear systems; bounded noise; disturbance sets; finite impulse response; optimal identification error; sample complexity; uncertainty set; upper bound; worst-case identification; Chebyshev approximation; Finite impulse response filter; Frequency domain analysis; Integrated circuit noise; Laboratories; Length measurement; Linear systems; Noise measurement; Nonlinear systems; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Decision and Control, 1993., Proceedings of the 32nd IEEE Conference on
  • Conference_Location
    San Antonio, TX
  • Print_ISBN
    0-7803-1298-8
  • Type

    conf

  • DOI
    10.1109/CDC.1993.325566
  • Filename
    325566