• DocumentCode
    2106682
  • Title

    An all-optical actuation and detection scheme for studying dissipation and materials properties of NEMS resonators

  • Author

    Verbridge, Scott S. ; Shapiro, Daniel Finkelstein ; Bunch, J. Scott ; van der Zande, A.M. ; McEuen, Paul L. ; Parpia, Jeevak M. ; Craighead, Harold G.

  • Author_Institution
    Cornell Univ., Ithaca
  • fYear
    2007
  • fDate
    21-25 Oct. 2007
  • Firstpage
    838
  • Lastpage
    839
  • Abstract
    The miniaturization of mechanical resonators continues to be of interest due to the basic physical insights into mechanical behavior at the nanoscale that can be provided, as well as the practical uses in sensing and signal processing to which such devices can be put. Some of the remaining open issues in this field pertain to the ultimate mass sensitivity of these structures, motivating the work presented in this paper. Specifically, we are interested in the factors that determine the dissipation, or quality factor, and the factors that limit the miniaturization that can be achieved with these structures.
  • Keywords
    Q-factor; absorbing media; actuators; beams (structures); light interferometry; measurement by laser beam; micro-optomechanical devices; micromechanical resonators; nanotechnology; silicon compounds; stress analysis; tensile testing; NEMS resonators; SiN; all-optical actuation; all-optical detection scheme; amplitude-modulated driving laser; continuous wave detection laser; dissipation properties; doubly-clamped silicon nitride devices; interferometry; materials properties; mechanical resonators miniaturization; nanomechanical beams resonance; quality factor; ultimate mass sensitivity; Compressive stress; Frequency; Material properties; Nanoelectromechanical systems; Nanoscale devices; Physics; Q factor; Resonance; Silicon; Tensile stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society, 2007. LEOS 2007. The 20th Annual Meeting of the IEEE
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    1092-8081
  • Print_ISBN
    978-1-4244-0925-9
  • Electronic_ISBN
    1092-8081
  • Type

    conf

  • DOI
    10.1109/LEOS.2007.4382669
  • Filename
    4382669