Title :
Digital spliced image forensics based on edge blur measurement
Author :
Zheng, Qianru ; Sun, Wei ; Lu, Wei
Author_Institution :
Sch. of Software, Sun Yat-sen Univ., Guangzhou, China
Abstract :
In this paper, a digital spliced image detection method based on edge blur measurement is proposed. The blur degree of edges in images is measured based on edge blur extension. The difference of blur degree between authentic images and spliced images is analyzed. The percentage of sharp edge is extracted as features, and used to classify the authentic images and spliced images. The experiments show that the proposed method is effective and the classification accuracy can reach 62% with only 1 kind of features.
Keywords :
feature extraction; object detection; authentic images; digital spliced image forensics; edge blur measurement; feature extraction; image detection method; Algorithm design and analysis; Chaotic communication; Encryption; Logistics; Parallel algorithms; Digital Image Forensics; Edge Blur Measurement; Image Splicing Detection;
Conference_Titel :
Information Theory and Information Security (ICITIS), 2010 IEEE International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-6942-0
DOI :
10.1109/ICITIS.2010.5689585