• DocumentCode
    2106950
  • Title

    A high density memory for SoC with a 143MHz SRAM interface using sense-synchronized-read/write

  • Author

    Taito, Y. ; Tanizaki, T. ; Kinoshita, M. ; Igaue, F. ; Fujino, T. ; Arimoto, K.

  • Author_Institution
    Mitsubishi Electr. Corp., Hyogo, Japan
  • fYear
    2003
  • fDate
    13-13 Feb. 2003
  • Firstpage
    306
  • Abstract
    A high density memory (HDRAM) for SoC with SRAM interface is described. This macro achieves no-wait fast random-cycle operation owing to a sense-synchronized read/write scheme. A 4Mb test device is fabricated in a 0.15/spl mu/m process and achieves 143MHz operation. Its size and standby power are 4.59mm/sup 2/ and 92mW, which are 30% and 4.8%, respectively, of an embedded SRAM macro fabricated identically.
  • Keywords
    DRAM chips; system-on-chip; timing; 0.15 micron; 143 MHz; 4 Mbit; 92 mW; HDRAM; SRAM interface; SoC; high density memory; no-wait fast random-cycle operation; sense-synchronized-read/write; size; standby power; Circuit simulation; Delay effects; Energy consumption; Flip-flops; Logic circuits; MOSFETs; Random access memory; Temperature sensors; Timing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. 2003 IEEE International
  • Conference_Location
    San Francisco, CA, USA
  • ISSN
    0193-6530
  • Print_ISBN
    0-7803-7707-9
  • Type

    conf

  • DOI
    10.1109/ISSCC.2003.1234310
  • Filename
    1234310