Title :
Circuit yield of organic integrated electronics
Author :
Cantatore, E. ; Hart, C.M. ; Digioia, M. ; Gelinck, G.H. ; Geuns, T.C.T. ; Huitema, H.E.A. ; Schrijnemakers, L.R.R. ; van Veenendaal, E. ; de Leeuw, D.M.
Author_Institution :
Philips Res., Eindhoven, Netherlands
Abstract :
Research on organic electronics is focussed on materials and on the performance of discrete devices. Reliability and circuit yield is largely unexplored. Yield, based on measurements on digital organic circuits up to 1000 transistors, is described. The causes of yield loss are analyzed and design solutions to improve the yield are discussed.
Keywords :
digital integrated circuits; integrated circuit yield; organic semiconductors; circuit yield; digital circuit; organic integrated electronics; organic transistor; reliability; Circuit faults; Digital circuits; Electrodes; Flexible printed circuits; Insulation; Integrated circuit interconnections; Integrated circuit yield; Organic semiconductors; Polymer films; Semiconductor films;
Conference_Titel :
Solid-State Circuits Conference, 2003. Digest of Technical Papers. ISSCC. 2003 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7707-9
DOI :
10.1109/ISSCC.2003.1234346
