• DocumentCode
    2108296
  • Title

    Dynamic Simulation Of Multiple Trapping Processes And Anomalous Frequency Dependence In GaAs MESFETs

  • Author

    Ho, Shirun ; Oohira, Masaki ; Kagaya, Osamu ; Moriyoshi, Aya ; Mizuta, Hiroshi ; Yamaguchi, Ken

  • Author_Institution
    Hitachi Ltd.
  • fYear
    1993
  • fDate
    14-15 May 1993
  • Firstpage
    30
  • Lastpage
    31
  • Keywords
    Charge carrier processes; Current-voltage characteristics; Degradation; Electrodes; Electron traps; Frequency dependence; Gallium arsenide; Hysteresis; MESFETs; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Process and Device Modeling, 1993. (1993 VPAD) 1993 International Workshop on
  • Print_ISBN
    0-7803-1338-0
  • Type

    conf

  • DOI
    10.1109/VPAD.1993.724710
  • Filename
    724710
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2108296