Title : 
Resistive losses of conductors carrying SMPS current waveforms
         
        
            Author : 
Femia, Nicola ; Vitelli, M.
         
        
            Author_Institution : 
DIIIE, Universita di Salerno, Fisciano
         
        
        
        
        
            Abstract : 
Switch-mode power supplies (SMPS) generate distorted nonsinusoidal current waveforms flowing into conductors (wires, striplines, windings), which cause ohmic losses mainly ruled by the skin-effect. Skin effect is traditionally studied in the frequency domain; most studies on the effects of distorted SMPS current waveform are devoted to examine the so-called high-frequency effects, namely the behavior of components and systems at the switching frequency and its harmonics, considering a virtual sinusoidal steady-state operation at each frequency of the range under study. In this paper skin-effect has been studied in the time-domain by means of a formulation based on a magnetic vector potential A and on a scalar potential φ. The obtained results show that the equivalent per-unit length resistance of conductors carrying typical SMPS nonsinusoidal current waveforms depend both on switching frequency and duty-cycle and is rather different from DC and AC sinusoidal equivalent resistances.
         
        
            Keywords : 
harmonic analysis; harmonic distortion; losses; power conversion harmonics; skin effect; switched mode power supplies; switching convertors; time-domain analysis; SMPS; distorted SMPS current waveform; distorted nonsinusoidal current waveforms; duty-cycle; equivalent per-unit length conductor resistance; high-frequency effects; magnetic vector potential; ohmic losses; scalar potential; skin-effect; switch-mode power supplies; switching frequency; time-domain study;
         
        
        
        
            Conference_Titel : 
Industrial Electronics, 2002. ISIE 2002. Proceedings of the 2002 IEEE International Symposium on
         
        
            Print_ISBN : 
0-7803-7369-3
         
        
        
            DOI : 
10.1109/ISIE.2002.1025851