DocumentCode :
2109316
Title :
Extreme temperature electronics
Author :
Sadwick, L.P. ; Hwu, R.J. ; Chern, J.H.
Author_Institution :
InnoSys Inc., Salt Lake City, UT, USA
Volume :
4
fYear :
2004
fDate :
13-13 March 2004
Firstpage :
2528
Abstract :
In this paper a new class of electronic devices, called solid state vacuum devices (SSVDs), is presented and discussed with the primary focus aimed toward extreme environment applications. SSVDs, due to their intrinsic high temperature operation and radiation hardness, should be extremely well suited for extreme environments that exist both on Earth and, for example, on the planet Venus. SSVDs combine features inherent to solid state and vacuum electronics in this new class of devices. SSVDs can be used as high voltage/high power devices (from DC to well into the GHz range) or as SSI or MSI integrated circuits. SSVDs can be made in many different sizes and shapes to suit the application. SSVDs can be compact and lightweight. SSVDs are, by their very nature, high temperature electronics. Device parameters (e.g., gain, gm, output resistance, etc.) are design parameters that can be chosen to match the application. The power handling capability of SSVDs can range from less than milliwatts to easily more than tens of kilowatts. SSVD operation, parameters and performance results and information can be the focus of this presentation with the primary area of concentration on extreme environment high temperature applications.
Keywords :
high-temperature electronics; power field effect transistors; power integrated circuits; radiation hardening (electronics); space vehicle electronics; vacuum microelectronics; Earth; MSI integrated circuits; SSI integrated circuits; Venus; device parameters; electronic devices; extreme temperature electronics; high power devices; high temperature applications; high temperature electronics; high voltage devices; intrinsic high temperature operation; power handling capability; radiation hardness; solid state electronics; solid state vacuum devices; vacuum electronics; Electron emission; FETs; Fabrication; Silicon; Solid state circuits; Substrates; Temperature; Vacuum technology; Venus; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Aerospace Conference, 2004. Proceedings. 2004 IEEE
Conference_Location :
Big Sky, MT
ISSN :
1095-323X
Print_ISBN :
0-7803-8155-6
Type :
conf
DOI :
10.1109/AERO.2004.1368047
Filename :
1368047
Link To Document :
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