• DocumentCode
    2109316
  • Title

    Extreme temperature electronics

  • Author

    Sadwick, L.P. ; Hwu, R.J. ; Chern, J.H.

  • Author_Institution
    InnoSys Inc., Salt Lake City, UT, USA
  • Volume
    4
  • fYear
    2004
  • fDate
    13-13 March 2004
  • Firstpage
    2528
  • Abstract
    In this paper a new class of electronic devices, called solid state vacuum devices (SSVDs), is presented and discussed with the primary focus aimed toward extreme environment applications. SSVDs, due to their intrinsic high temperature operation and radiation hardness, should be extremely well suited for extreme environments that exist both on Earth and, for example, on the planet Venus. SSVDs combine features inherent to solid state and vacuum electronics in this new class of devices. SSVDs can be used as high voltage/high power devices (from DC to well into the GHz range) or as SSI or MSI integrated circuits. SSVDs can be made in many different sizes and shapes to suit the application. SSVDs can be compact and lightweight. SSVDs are, by their very nature, high temperature electronics. Device parameters (e.g., gain, gm, output resistance, etc.) are design parameters that can be chosen to match the application. The power handling capability of SSVDs can range from less than milliwatts to easily more than tens of kilowatts. SSVD operation, parameters and performance results and information can be the focus of this presentation with the primary area of concentration on extreme environment high temperature applications.
  • Keywords
    high-temperature electronics; power field effect transistors; power integrated circuits; radiation hardening (electronics); space vehicle electronics; vacuum microelectronics; Earth; MSI integrated circuits; SSI integrated circuits; Venus; device parameters; electronic devices; extreme temperature electronics; high power devices; high temperature applications; high temperature electronics; high voltage devices; intrinsic high temperature operation; power handling capability; radiation hardness; solid state electronics; solid state vacuum devices; vacuum electronics; Electron emission; FETs; Fabrication; Silicon; Solid state circuits; Substrates; Temperature; Vacuum technology; Venus; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Aerospace Conference, 2004. Proceedings. 2004 IEEE
  • Conference_Location
    Big Sky, MT
  • ISSN
    1095-323X
  • Print_ISBN
    0-7803-8155-6
  • Type

    conf

  • DOI
    10.1109/AERO.2004.1368047
  • Filename
    1368047