Title :
Image Denoising Using the Higher Order Singular Value Decomposition
Author :
Rajwade, Ajit ; Rangarajan, Anand ; Banerjee, Adrish
Author_Institution :
DA-IICT, Gandhinagar, India
Abstract :
In this paper, we propose a very simple and elegant patch-based, machine learning technique for image denoising using the higher order singular value decomposition (HOSVD). The technique simply groups together similar patches from a noisy image (with similarity defined by a statistically motivated criterion) into a 3D stack, computes the HOSVD coefficients of this stack, manipulates these coefficients by hard thresholding, and inverts the HOSVD transform to produce the final filtered image. Our technique chooses all required parameters in a principled way, relating them to the noise model. We also discuss our motivation for adopting the HOSVD as an appropriate transform for image denoising. We experimentally demonstrate the excellent performance of the technique on grayscale as well as color images. On color images, our method produces state-of-the-art results, outperforming other color image denoising algorithms at moderately high noise levels. A criterion for optimal patch-size selection and noise variance estimation from the residual images (after denoising) is also presented.
Keywords :
filtering theory; image colour analysis; image denoising; learning (artificial intelligence); singular value decomposition; 3D stack; HOSVD coefficients; HOSVD transform; color images; grayscale images; hard thresholding; higher order singular value decomposition; image denoising; image filtering; noise variance estimation; noisy image; optimal patch-size selection; patch-based machine learning technique; residual images; Image denoising; Noise measurement; Noise reduction; PSNR; Singular value decomposition; Transforms; Image denoising; coefficient thresholding; higher order singular value decomposition (HOSVD); learning orthonormal bases; patch similarity; singular value decomposition (SVD);
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on
DOI :
10.1109/TPAMI.2012.140