DocumentCode
2109715
Title
Global albedo, BRDF and nadir BRDF-adjusted reflectance products from MODIS
Author
Schaaf, Crystal ; Strahler, Alan ; Gao, Feng ; Lucht, Wolfgang ; Jin, Yufang ; Li, Xiaowen ; Zhang, Xiaoyang ; Tsvetsinskaya, Elena ; Muller, Jan-Peter ; Lewis, Phillip ; Barnsley, Michael ; Roberts, Gareth ; Doll, Christopher ; Liang, Shunlin ; Roy, Davi
Author_Institution
Dept. of Geogr., Boston Univ., MA, USA
Volume
2
fYear
2002
fDate
24-28 June 2002
Firstpage
1188
Abstract
Annual sequences of the first reprocessed albedo, bidirectional reflectance distribution function (BRDF), and nadir BRDF-adjusted surface reflectance (NBAR) products are being evaluated. BRDF model parameters (or weights) are used to compute black sky albedo at local solar noon and white sky albedo and to compute surface reflectance at a common nadir geometry. In addition to these standard resolution albedo, BRDF, and NBAR products, which are provided in the integerized sinusoidal grid projection, the BRDF parameters, black sky albedos (at local solar noon), and white sky albedos are now also being operationally produced in a global geographic projection known as the Climate Modeling Grid (CMG). These are currently available at a 0.25 degree spatial resolution, although there is community interest in a 0.05 degree resolution. In addition to the operational CMGs, coarser 0.5 degree and 1 degree resolution versions of the reprocessed albedo data have also been produced for the ISLSCP-II initiative. The global distribution of these albedos (as they vary throughout the year) are presented, as well as discussions of the most recent evaluations of the quality of the standard products.
Keywords
albedo; reflectivity; remote sensing; BRDF; Climate Modeling Grid; ISLSCP-II; MODIS products; NBAR; black sky albedo; global albedo; global geographic projection; integerized sinusoidal grid projection; local solar noon; nadir bidirectional reflectance distribution function; standard resolution albedo; surface reflectance; white sky albedo; Atmospheric modeling; Bidirectional control; Distribution functions; Educational institutions; Geography; MODIS; Reflectivity; Remote sensing; Spatial resolution; Tiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Geoscience and Remote Sensing Symposium, 2002. IGARSS '02. 2002 IEEE International
Print_ISBN
0-7803-7536-X
Type
conf
DOI
10.1109/IGARSS.2002.1025877
Filename
1025877
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